High-resolution Raman microscopy of curled carbon nanotubes

摘要

Patterned carbon nanotube assemblies with bent nanotube bundles were investigated with combined atomic force microscopy and confocal Raman imaging spectroscopy to identify conditions of carbon nanotubes in the bent state. We showed that the tangential G mode on Raman spectra systematically shifts downward upon nanotube bending as was predicted earlier. This lower frequency shift is attributed to the tensile stress, which results in the loosening of C-C bonds in the outer nanotube walls. (C) American Institute of Physics.