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Intrinsic and extrinsic contributions to the lattice parameter of GaMnAs

机译:GaMnAs晶格参数的内在和外在贡献

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We report on measurements of the crystal structure and hole density in a series of as-grown and annealed GaMnAs samples. The measured hole densities are used to obtain the fraction of incorporated Mn atoms occupying interstitial and substitutional sites. This allows us to make a direct comparison of the measured lattice parameters with recent density-functional theory (DFT) predictions. We find that the decrease in lattice constant observed on annealing is smaller than that predicted due to the out-diffusion of interstitial Mn during annealing. The measured lattice parameters after annealing are still significantly larger than that of GaAs even in samples with very low compensation. This indicates that the intrinsic lattice parameter of GaMnAs is significantly larger than that of GaAs, in contradiction to the DFT prediction.
机译:我们报告了一系列生长和退火的GaMnAs样品的晶体结构和孔密度的测量结果。所测量的空穴密度用于获得所占据的Mn原子占据间隙和取代位点的比例。这使我们能够将测得的晶格参数与最新的密度泛函理论(DFT)预测进行直接比较。我们发现,在退火过程中观察到的晶格常数的减小小于所预测的,这是由于间隙Mn在退火过程中向外扩散所致。即使在补偿非常低的样品中,退火后测得的晶格参数仍显着大于GaAs。这表明与DFT预测相反,GaMnAs的固有晶格参数明显大于GaAs的固有晶格参数。

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