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首页> 外文期刊>Applied Physics Letters >Low driving voltage and high stability organic light-emitting diodes with rhenium oxide-doped hole transporting layer
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Low driving voltage and high stability organic light-emitting diodes with rhenium oxide-doped hole transporting layer

机译:具有掺杂氧化oxide的空穴传输层的低驱动电压和高稳定性的有机发光二极管

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摘要

The authors report a promising metal oxide-doped hole transporting layer (HTL) of rhenium oxide (ReO_3)-doped N,N′-diphenyl-N,N′-bis (1,1′-biphenyl)-4,4′-diamine (NPB). The tris(8-hydroxyquinoline) aluminum-based organic light-emitting diodes with ReO_3-doped NPB HTL exhibit driving voltage of 5.2-5.4 V and power efficiency of 2.2-2.3 lm/W at 20 mA/cm~2, which is significantly improved compared to those (7.1 V and 2.0 lm/W, respectively) obtained from the devices with undoped NPB. Furthermore, the device with ReO_3-doped NPB layer reveals the prolonged lifetime than that with undoped NPB. Details of ReO_3 doping effects are described based on the UV-Vis absorption spectra and characteristics of hole-only devices.
机译:作者报告了一种有前途的掺杂氧化oxide(ReO_3)的N,N'-联苯-N,N'-双(1,1'-联苯)-4,4'-的掺杂金属氧化物的空穴传输层(HTL)。二胺(NPB)。掺有ReO_3的NPB HTL的三(8-羟基喹啉)铝基有机发光二极管在20 mA / cm〜2的驱动电压为5.2-5.4 V,功率效率为2.2-2.3 lm / W,这是非常明显的与从未掺杂NPB的器件获得的功率(分别为7.1 V和2.0 lm / W)相比,该器件得到了改进。此外,具有ReO_3掺杂的NPB层的器件比未掺杂NPB的器件具有更长的寿命。基于UV-Vis吸收光谱和仅空穴器件的特性,描述了ReO_3掺杂效应的细节。

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