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Defect-induced electrical conductivity increase in individual multiwalled carbon nanotubes

机译:单个多壁碳纳米管中缺陷诱导的电导率增加

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The authors demonstrate that ozone exposure of individual multiwalled carbon nanotubes (CNTs) results in up to threefold increase in CNT conductivity and 50% decrease in carrier transport activation energy. Ozone exposure induces bond breaking in the individual shells and promotes cross-shell bridging via sp3 bond formation. Intershell bridging facilitates charge carrier hopping to inner shells, which can serve as additional charge carrier transport pathways, offsetting the effect of defect-scattering-induced conductivity decrease. The CNT etch rate systematically increases with decreasing initial outer diameter and decreases with incremental ozone exposure, which could provide means to controllably tailor the CNT conductance. The results suggest that controlled defect creation could be an attractive strategy to induce electrical conductivity increase in multiwalled CNTs for use in nanodevice wiring and related applications.
机译:作者证明,单个多壁碳纳米管(CNT)的臭氧暴露导致CNT电导率增加多达三倍,而载流子传输活化能降低了50%。臭氧暴露会引起单个壳中的键断裂,并通过sp3键的形成促进跨壳桥接。壳间桥接有助于电荷载流子跳到内壳,这可以用作附加的电荷载流子传输路径,从而抵消了缺陷扩散引起的电导率降低的影响。 CNT刻蚀速率随着初始外径的减小而系统地增加,并且随着臭氧暴露量的增加而减小,这可以提供可控地调节CNT电导的方法。结果表明,受控缺陷的产生可能是诱使用于纳米器件布线和相关应用的多壁CNT电导率增加的诱人策略。

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