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Direct measurement of magnetoelectric exchange in self-assembled epitaxial BiFeO_3-CoFe_2O_4 nanocomposite thin films

机译:自组装外延BiFeO_3-CoFe_2O_4纳米复合薄膜中磁电交换的直接测量

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摘要

We report the direct measurement of a magnetoelectric (ME) exchange between magnetostrictive CoFe_2O_4 nanopillars in a piezoelectric BiFeO_3 matrix for single-layer nanocomposite epitaxial thin films grown on (001) SrTiO_3 substrates with SrRuO_3 bottom electrodes. The ME coefficient was measured by a magnetic cantilever method and had a maximum value of ~20 mV/cm Oe. The films possessed saturation polarization (60 μC/cm~2) and magnetization (410 emu/cc) properties equivalent to bulk values, with typical hysteresis loops.
机译:我们报告了在压电BiFeO_3基质中的磁致伸缩CoFe_2O_4纳米柱之间的磁电(ME)交换的直接测量,该压电BiFeO_3基质生长在具有SrRuO_3底部电极的(001)SrTiO_3衬底上的单层纳米复合外延薄膜。 ME系数通过磁悬臂法测量,最大值约为〜20 mV / cm Oe。薄膜具有饱和极化强度(60μC/ cm〜2)和磁化强度(410 emu / cc)等效于体积值,并具有典型的磁滞回线。

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  • 来源
    《Applied Physicsletters》 |2009年第19期|139-141|共3页
  • 作者单位

    Department of Materials Science and Engineering, Virginia Tech, Blacksburg, Virginia 24061, USA;

    Department of Materials Science and Engineering, Virginia Tech, Blacksburg, Virginia 24061, USA;

    Department of Materials Science and Engineering, Virginia Tech, Blacksburg, Virginia 24061, USA;

    Department of Materials Science and Engineering, Virginia Tech, Blacksburg, Virginia 24061, USA;

    Department of Materials Science and Engineering, Virginia Tech, Blacksburg, Virginia 24061, USA;

    Department of Materials Science and Engineering, Virginia Tech, Blacksburg, Virginia 24061, USA;

    Department of Materials Science and Engineering, Virginia Tech, Blacksburg, Virginia 24061, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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