Toward determinism in surface damaging of dielectrics using few-cycle laser pulses

摘要

We introduce a quantitative measurement of the determinism of laser-induced damaging at the surface of a dielectric material, e.g., fused silica. Using laser pulses ranging from 7 to 300 fs, we demonstrate that laser damage occurrence tends to be dramatically deterministic at 7 fs, which is attributed to the increasing importance of tunneling ionization as the major channel for the generation of free-carriers in the conduction band.