机译:In_(0.53)Ga_(0.47)Bi_xAs_(1-x)合金中E_0和E_0 +△_(SO)跃迁的非接触电反射率研究
Institute of Physics, Wroclaw University of Technology, Wybrzeze Wyspianskiego 27,50-370 Wroclaw, Poland;
Institute of Physics, Wroclaw University of Technology, Wybrzeze Wyspianskiego 27,50-370 Wroclaw, Poland;
Institute of Physics, Wroclaw University of Technology, Wybrzeze Wyspianskiego 27,50-370 Wroclaw, Poland;
Department of Electrical and Computer Engineering, University of Delaware, Newark, Delaware 19716, USA;
Department of Materials Science and Engineering, University of Delaware, Newark, Delaware 19716, USA;
Department of Materials Science and Engineering, University of Delaware, Newark, Delaware 19716, USA;
机译:通过光反射研究In_(0.53)Ga_(0.47)Bi_xAs_(1-x)合金中E_0和E_0 +△_(so)转变的温度依赖性
机译:In_(0.53)Ga_(0.47)As / In_(0.53)Ga_(0.23)Al_(0.24)As量子阱和InAs量子破折线组成的隧道注入结构中光学跃迁的非接触电反射
机译:使用In_(0.53)Ga_(0.47)As / In_xGa_(1-x)As / In_(0.53)Ga_(0.47)As量子阱的平面型隧道FET的设计和性能
机译:研究合金化和非合金欧姆接触掺杂通道IN_(0.8)GA_(0.2)P / IN_(0.53)GA_(0.47),AS / INP HFET,具有超过170GHz的f_t和f_(max)
机译:InP / In_ {0.53} Ga_ {0.47} As界面对In_ {0.52} Al_ {0.48} As / In_ {0.53} Ga_ {0.47} As异质结构中自旋轨道相互作用的影响
机译:半导体的缺陷。硅,si(1-x)Ge(x)和In(0.53)Ga(0.47)as的光学和电学研究