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Charge injection across a metal-organic interface suppressed by thermal diffusion

机译:通过热扩散抑制了跨金属-有机界面的电荷注入

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摘要

We find that the ohmic conductance of Co-phthalocyanine (CoPc) vertical capacitive devices is irreversibly suppressed by orders of magnitude when they are heated above 340 K. Detailed structural and transport studies imply that the changes in the conductance are due to diffusion of the top Pd electrode into the CoPc layer. This leads to a decrease in Pd electrode effective work function, which increases the potential barrier for hole injection.
机译:我们发现,当加热到340 K以上时,钴酞菁(CoPc)垂直电容器件的欧姆电导被不可逆地抑制了几个数量级。详细的结构和传输研究表明,电导率的变化是由于顶部的扩散钯电极进入CoPc层。这导致Pd电极的有效功函数降低,从而增加了空穴注入的势垒。

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  • 来源
    《Applied Physics Letters》 |2014年第4期|043301.1-043301.5|共5页
  • 作者单位

    Department of Physics, Center for Advanced Nanoscience, University of California San Diego, 9500 Gilman Drive, La Jolla, California 92093, USA;

    Department of Physics, Center for Advanced Nanoscience, University of California San Diego, 9500 Gilman Drive, La Jolla, California 92093, USA;

    Department of Physics, Center for Advanced Nanoscience, University of California San Diego, 9500 Gilman Drive, La Jolla, California 92093, USA;

    Department of Physics, Center for Advanced Nanoscience, University of California San Diego, 9500 Gilman Drive, La Jolla, California 92093, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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