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Analytical energy-barrier-dependent V_(oc) model for amorphous silicon solar cells

机译:非晶硅太阳能电池的依赖于能垒的解析V_(oc)模型

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摘要

We show that the open circuit voltage (V_(oc)) in hydrogenated amorphous silicon (a-Si:H) solar cells can be described by an analytical energy-barrier-dependent equation, considering thermionic emission as the physical mechanism determining the recombination current. For this purpose, the current-voltage characteristics of two device structures, i.e., a-Si:H(n)/a-Si:H(i)/a-Si:H(p)/AZO p-i-n solar cells with different p-doping concentrations and a-Si:H(n)/a-Si:H(i)/AZO Schottky structures with different intrinsic layer thicknesses, were analyzed in dark and under illumination, respectively. The calculated barrier in the p-i-n devices is consistent with the difference between the work function of the p-layer and the conduction band edge of the i-layer at the interface in thermal equilibrium.
机译:我们表明氢化非晶硅(a-Si:H)太阳能电池中的开路电压(V_(oc))可以通过与能垒有关的解析方程来描述,将热电子发射作为决定复合电流的物理机制。为此,采用两种器件结构的电流-电压特性,即a-Si:H(n)/ a-Si:H(i)/ a-Si:H(p)/具有不同p的AZO引脚太阳能电池分别在黑暗和光照下分析了具有不同本征层厚度的掺杂浓度和a-Si:H(n)/ a-Si:H(i)/ AZO肖特基结构。在p-i-n器件中计算出的势垒与p层的功函数与i层在热平衡界面处的i层的导带边缘之间的差异一致。

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  • 来源
    《Applied Physics Letters》 |2016年第4期|043503.1-043503.5|共5页
  • 作者单位

    Institute of Solid State Physics, University of Bremen, 28359 Bremen, Germany;

    Energy and Semiconductor Research Laboratory, Carl von Ossietzky University of Oldenburg, 26129 Oldenburg, Germany;

    NEXT ENERGY-EWE Research Centre for Energy Technology at Carl von Ossietzky University of Oldenburg, 26129 Oldenburg, Germany;

    NEXT ENERGY-EWE Research Centre for Energy Technology at Carl von Ossietzky University of Oldenburg, 26129 Oldenburg, Germany;

    NEXT ENERGY-EWE Research Centre for Energy Technology at Carl von Ossietzky University of Oldenburg, 26129 Oldenburg, Germany;

    Energy and Semiconductor Research Laboratory, Carl von Ossietzky University of Oldenburg, 26129 Oldenburg, Germany;

    Institute of Solid State Physics, University of Bremen, 28359 Bremen, Germany,MAPEX Center of Materials and Processes, University of Bremen, 28359 Bremen, Germany;

    Institute of Semiconductor Technology, Braunschweig University of Technology, 38092 Braunschweig, Germany,Laboratory for Emerging Nanometrology (LENA), Braunschweig University of Technology, 38092 Braunschweig, Germany;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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  • 入库时间 2022-08-18 03:14:43

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