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Temperature-dependent performance of all-NbN DC-SQUID magnetometers

机译:全NbN DC-SQUID磁力计的温度相关性能

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摘要

Integrated NbN direct current superconducting quantum interference device (DC-SQUID) magnetometers were developed based on high-quality epitaxial NbN/AlN/NbN Josephson junctions for SQUID applications operating at high temperatures. We report the current-voltage and voltage-flux characteristics and the noise performance of the NbN DC-SQUIDs for temperatures ranging from 4.2 to 9 K. The critical current and voltage swing of the DC-SQUIDs decreased by 15% and 25%, respectively, as the temperature was increased from 4.2 to 9 K. The white flux noise of the DC-SQUID magnetometer at 1 kHz increased from 3.9 μФ_0/Hz~(1/2) at 4.2 K to 4.8 μФ_0/Hz~(1/2) at 9 K with 23% increase, corresponding to the magnetic field noise of 6.6 and 8.1 fT/Hz~(1/2), respectively. The results show that NbN DC-SQUIDs improve the tolerance of the operating temperatures and temperature fluctuations in SQUID applications. Published by AIP Publishing.
机译:基于高质量外延NbN / AlN / NbN Josephson结的集成NbN直流超导量子干扰设备(DC-SQUID)磁力计是为高温下运行的SQUID应用开发的。我们报告了NbN DC-SQUID在4.2至9 K的温度范围内的电流-电压和电压通量特性以及噪声性能。DC-SQUID的临界电流和电压摆幅分别降低了15%和25% ,随着温度从4.2 K升高到9K。DC-SQUID磁力计在1 kHz时的白磁通噪声从4.2 K时的3.9μФ_0/ Hz〜(1/2)增加到4.8μФ_0/ Hz〜(1/2) )在9 K下以23%的速度增加,分别对应于6.6和8.1 fT / Hz〜(1/2)的磁场噪声。结果表明,NbN DC-SQUID提高了SQUID应用中的工作温度容限和温度波动。由AIP Publishing发布。

著录项

  • 来源
    《Applied Physics Letters》 |2017年第22期|222604.1-222604.4|共4页
  • 作者单位

    Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, 865 Chang Ning Road, Shanghai 200050, China,Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai 200050, China,University of Chinese Academy of Sciences, 19 A Yuquan Road, Beijing 100049, China;

    Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, 865 Chang Ning Road, Shanghai 200050, China,Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai 200050, China;

    Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, 865 Chang Ning Road, Shanghai 200050, China,Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai 200050, China,University of Chinese Academy of Sciences, 19 A Yuquan Road, Beijing 100049, China;

    Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, 865 Chang Ning Road, Shanghai 200050, China,Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai 200050, China,University of Chinese Academy of Sciences, 19 A Yuquan Road, Beijing 100049, China;

    Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, 865 Chang Ning Road, Shanghai 200050, China,Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai 200050, China;

    Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, 865 Chang Ning Road, Shanghai 200050, China,Chinese Academy of Sciences, Center for Excellence in Superconducting Electronics (CENSE), 865 Chang Ning Road, Shanghai 200050, China,University of Chinese Academy of Sciences, 19 A Yuquan Road, Beijing 100049, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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  • 入库时间 2022-08-18 03:14:05

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