机译:通过光谱椭偏仪,RBS / ERDA和NEXAFS分析非晶碳膜的结构
Graduate School of Engineering, Nagaoka University of Technology, 1603-1 Kamitomioka-machi, Nagaoka, Niigata 940-2188, Japan;
Extreme Energy-Density Research Institute, Nagaoka University of Technology, 1603-1 Kamitomioka-machi, Nagaoka, Niigata 940-2188, Japan;
Synchrotron Light Research Institute (Public Organization), 111 University Avenue, Muang District, Nakhon Ratchasima 30000, Thailand;
Graduate School of Engineering, Nagaoka University of Technology, 1603-1 Kamitomioka-machi, Nagaoka, Niigata 940-2188, Japan;
Laboratory of Advanced Science and Technology for Industry, University of Hyogo, 3-1-2 Koto, Kamaigori-cho, Ako-gun, Hyogo 678-1205, Japan;
Graduate School of Engineering, Nagaoka University of Technology, 1603-1 Kamitomioka-machi, Nagaoka, Niigata 940-2188, Japan;
Graduate School of Engineering, Nagaoka University of Technology, 1603-1 Kamitomioka-machi, Nagaoka, Niigata 940-2188, Japan;
机译:基于光谱椭圆测量测量的BEMA理论对非晶碳膜的结构分析
机译:非晶态碳和非晶态,石墨态和富勒烯状氮化碳薄膜的椭圆偏振光谱表征
机译:弹性反冲检测分析(ERDA),电子能量损失谱(EELS)和X射线光电子能谱(XPS)用于非晶氮化碳膜结构分析的比较研究
机译:光谱椭偏法研究磁过滤碳离子沉积制备非晶碳膜sp〜3馏分的偏置电压依赖性
机译:通过超临界二氧化碳处理的纳米微孔低介电常数薄膜的光谱椭圆偏振分析,适用于下一代微电子设备。
机译:具有高表面粗糙度的薄膜:使用椭圆偏振光谱仪进行厚度和介电函数分析
机译:光谱椭圆形测定法,RBS / ERDA和NEXAF的非晶碳膜结构分析