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Enhanced photoresponsivity of multilayer MoS_2 transistors using high work function MoO_x overlayer

机译:使用高功函数MoO_x覆盖层增强多层MoS_2晶体管的光响应性

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摘要

Using thin sub-stoichiometric molybdenum trioxide (MoO_x, x < 3) overlayer, we demonstrate over 20-folds enhanced photoresponsivity of multilayer MoS_2 field-effect transistor. The fabricated device exhibits field-effect mobility (μ_(FE)) of up to 41.4cm~2/V s and threshold voltage (V_(TH)) of —9.3 V, which is also modulated by the MoO_x overlayer. The MoO_x layer (~25nm), commonly known for a high work function (~6.8 eV) material with a band gap of ~3 eV, is evaporated on top of the MoS_2 channel and confirmed by the transmission electron microscope analysis. The electrical and optical modulation effects are associated with interfacial charge transfer and thus an induced built-in electric field at the MoS_2/MoO_x interface. The results show that high work function MoO_x can be a promising heterostructure material in order to enhance the photoresponse characteristics of MoS_2-based devices.
机译:使用薄的亚化学计量的三氧化钼(MoO_x,x <3)覆盖层,我们证明了多层MoS_2场效应晶体管的光响应性提高了20倍以上。所制造的器件展现出高达41.4cm〜2 / V s的场效应迁移率(μ_(FE))和-9.3 V的阈值电压(V_(TH)),该阈值电压也由MoO_x上层调制。 MoO_x层(〜25nm)通常​​以带隙为〜3 eV的高功函(〜6.8 eV)材料而闻名,在MoS_2通道顶部蒸发并通过透射电子显微镜分析确认。电和光调制效应与界面电荷转移相关,因此与MoS_2 / MoO_x界面处的感应内置电场相关。结果表明,高功函数MoO_x可以作为一种有前途的异质结构材料,以增强基于MoS_2的器件的光响应特性。

著录项

  • 来源
    《Applied Physics Letters》 |2017年第5期|053112.1-053112.4|共4页
  • 作者单位

    School of Electronic Engineering, Soongsil University, Seoul 06938, South Korea;

    School of Advanced Materials Science & Engineering, Sungkyunkwan University, 300, Chunchun-dong, Jangan-gu, Suwon, 16419, South Korea;

    Department of Electrical and Computer Engineering, Ajou University, Suwon 16499, South Korea;

    School of Advanced Materials Science & Engineering, Sungkyunkwan University, 300, Chunchun-dong, Jangan-gu, Suwon, 16419, South Korea;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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  • 入库时间 2022-08-18 03:13:59

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