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Reduction of sidelobe and speckle artifacts in microwave imaging: the CLEAN technique

机译:减少微波成像中的旁瓣和斑点伪影:CLEAN技术

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Large random thin arrays provide a high angular resolution microwave images but are plagued with artifacts (false targets and target breakup or speckle) caused by high sidelobe levels. The CLEAN algorithm for reducing the sidelobe-induced artifacts is extended to the coherent radiation field and the theory placed on a quantitative basis. The CLEAN technique decomposes the received echoes of a coherent multiple-target scene by iterative cancellation of the largest target found. At each step, cancellation information is used to create a target image. The image includes target intensities, phases, and directions. The process is designed for an imaging instrument consisting of a random thinned array. A condition is derived which, when satisfied, guarantees that all proper targets will be preserved in the cleaned image and all false targets discarded. An algorithm involving moving thresholds is derived to extract the target coordinates. It is shown that targets much weaker than the sidelobe level can be detected and displayed without the hazard of artifacts. The target dynamic range and the image contrast can be increased by up to twice the signal-to-noise ratio per element.
机译:大型随机薄阵列可提供高角度分辨率的微波图像,但会受到高旁瓣电平引起的伪影(错误目标和目标破裂或斑点)的困扰。用于减少旁瓣引起的伪影的CLEAN算法已扩展到相干辐射场,并将该理论置于定量基础上。 CLEAN技术通过迭代消除找到的最大目标来分解相干多目标场景的接收回波。在每个步骤中,取消信息都用于创建目标图像。该图像包括目标强度,相位和方向。该过程专为包含随机变薄阵列的成像仪器而设计。得出一个条件,该条件满足后,将保证所有适当的目标都将保留在清洁的图像中,并且所有错误的目标都将被丢弃。导出涉及移动阈值的算法以提取目标坐标。结果表明,可以检测和显示比旁瓣水平弱得多的目标,而不会产生伪影。每个元件的目标动态范围和图像对比度可以增加高达两倍的信噪比。

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