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首页> 外文期刊>IEEE Transactions on Antennas and Propagation >Measurement and modeling of a microwave active-patch phased array for wide-angle scanning
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Measurement and modeling of a microwave active-patch phased array for wide-angle scanning

机译:用于广角扫描的微波有源贴片相控阵的测量和建模

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摘要

An active antenna consisting of an integrated oscillator with a passive radiator has been arrayed and beam-scanned using a new principle for phase shifting. The radiating elements consist of a transistor oscillator whose frequency is controlled by a rectangular microstrip patch antenna. Each oscillator is injection locked to an external source. The phase control of the radiated wave is achieved by varying the bias on the transistor. Individual element performance has been characterized for potential use as an array element and is comprehensively reported. Methods used to achieve configurations with full 360/spl deg/ phase control have been investigated utilizing novel configurations and cascaded oscillator pairs. Close to 360/spl deg/ of radiated phase control from each element has been achieved. Measured results on an experimental four-element S-band array indicate that beam scanning in excess of /spl plusmn/60/spl deg/ can be achieved. Mutual coupling effects on this new form of array are studied both experimentally and theoretically. A van der Pol (1934) model for the weak coupling that is occurring on the array is developed and used to qualitatively predict the phase offsetting on array elements. Reasonable agreement between theory and experiment is obtained and it is observed that good control of the coupling mechanism is essential to array performance within this new form of active integrated phase shifterless array.
机译:有源天线由一个带有无源辐射器的集成振荡器组成,已经使用新的移相原理进行了排列和波束扫描。辐射元件由晶体管振荡器组成,其频率由矩形微带贴片天线控制。每个振荡器都注入锁定到外部源。辐射波的相位控制是通过改变晶体管上的偏置来实现的。单个元素的性能已被表征为可能用作数组元素,并且已得到全面报道。利用新颖的配置和级联振荡器对,研究了用于实现具有完整360 / spl度/相位控制的配置的方法。每个元件的辐射相位控制接近360 / spl deg /。在实验性的四元素S波段阵列上的测量结果表明,可以实现超过/ spl plusmn / 60 / spl deg /的光束扫描。在实验和理论上都研究了这种新型阵列的互耦效应。针对阵列上发生的弱耦合的Van der Pol(1934)模型被开发出来,并用于定性地预测阵列元件上的相位偏移。理论与实验之间取得了合理的一致性,并且观察到在这种新型的有源集成无相移阵列中,对耦合机制的良好控制对于阵列性能至关重要。

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