On the relationship for the bistatic modulated scattering techniquein scattering applications using scattering properties of antennas

摘要

The relation between the measured voltage and the unperturbed electric field at the probe position, which is the starting point for the development of measurement systems based on the modulated scattering technique, is considered. In particular, this relation is derived for the bistatic setup used for field measurements in scattering applications. The assumed probe is a short dipole and the analysis is performed by using the scattering properties of passive antennas