'08 SRC Covers Lot of Ground

摘要

The 2008 Spring Research Conference (SRC) on Statistics in Industry and Technology took place at Georgia Institute of Technology in Atlanta May 19-21. This year's conference included 110 participants and featured plenary speakers Peter Bickel of the University of California, Berkeley; James Glimm, National Medal of Science recipient from SUNY, Stony Brook; and Zhong Lin Wang, director of the Center for Nanostructure Characterization at Georgia Tech. The campus hosts were accommodating and the talks especially stimulating. Along with 10 contributed sessions, the conference had 13 invited sessions on topics such as DOE computer experiments, statistics in nanomanufacturing, health process monitoring, recent European advances in design of industrial experiments, modeling credit risk portfolios in retail banking, multiscale modeling, machine learning, reliability in industrial experiments, and analysis of supersaturated design.