Compact Aberration-Corrected Spectrometers in the Visible Using Dispersion-Tailored Metasurfaces

著录项

• 来源
  《Advanced Optical Materials》 |2019年第14期|1801144.1-1801144.8|共8页
• 作者

  Alexander Y.Zhu; Wei TingChen; JaredSisler; Kerolos M. A.Yousef; EricLee; YaoWeiHuang; ChengWeiQiu; FedericoCapasso;

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• 作者单位

  Harvard John A. Paulson School of Engineering and Applied Sciences,Harvard University,Cambridge,MA,USA;

  Harvard John A. Paulson School of Engineering and Applied Sciences,Harvard University,Cambridge,MA,USA;

  Harvard John A. Paulson School of Engineering and Applied Sciences,Harvard University,Cambridge,MA,USA;

  Harvard John A. Paulson School of Engineering and Applied Sciences,Harvard University,Cambridge,MA,USA;

  Harvard John A. Paulson School of Engineering and Applied Sciences,Harvard University,Cambridge,MA,USA;

  Harvard John A. Paulson School of Engineering and Applied Sciences,Harvard University,Cambridge,MA,USA;

  National University of Singapore,Singapore,Singapore;

  Harvard John A. Paulson School of Engineering and Applied Sciences,Harvard University,Cambridge,MA,USA;

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• 收录信息
• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词

  aberration corrected; metasurfaces; offaxis lens; spectroscopy;

  机译：像差纠正;元件;脱裂镜头;光谱;