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Local Multimodal Electro-Chemical-Structural Characterization of Solid-Electrolyte Grain Boundaries

机译:固体电解质晶界的局部多峰电化学结构表征

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摘要

Typical models of polycrystalline ionic materials treat the grain boundary properties as single valued, without consideration of the full range of values that define the macroscopically measured average. Here a unique experimental platform suitable for local multimodal characterization of individual grain boundaries in bicrystal fibers is reported. A variation of three orders of magnitude in the grain boundary conductivity of ceria is observed, as measured across six individual bicrystals by both alternating current impedance spectroscopy and direct current (D.C.) linear sweep voltammetry. Nonlinear behavior of the D.C. measurements is consistent with resistance due to a space charge effect. Time-of-flight secondary ion beam spectroscopy reveals a correlation between grain boundary resistance and the concentration of impurities Si, Al, and Ca segregated at the grain boundaries, although the bulk concentrations of these impurities are negligible. Electron backscatter diffraction analysis of the crystal orientations suggests a correlation between the misorientation across the grain boundaries and grain boundary resistance. These correlations point towards a grain boundary resistance that arises from impurity-generated space charge effects and variations in impurity concentration and hence resistivity driven by the energetics of impurity segregation to grain boundaries of differing surface energies.
机译:多晶离子材料的典型模型将晶界性能处理为单一值,不考虑定义宏观测量平均值的全部值。这里据报道,一种独特的实验平台,适用于局部晶体纤维中单个晶界的局部多峰表征。观察到在二氧化铈的晶界电导率中的三个数量级的变化,如通过交流阻抗光谱和直流(D.C.)线性扫描伏安法在六个单独的双晶上测量。 D.C的非线性行为。测量与由于空间电荷效应引起的电阻一致。飞行时间二次离子束光谱揭示晶际抗缘和杂质Si,Al和Ca浓度之间的相关性,但这些杂质的堆积浓度可忽略不计。晶体取向的电子反向散射衍射分析表明,晶界横跨晶界和晶界阻力之间的误导性之间的相关性。这些相关性朝向杂质产生的空间电荷效应和杂质浓度的变化产生的晶际电阻点,因此由杂质偏析的能量偏析驱动的电阻率与不同的表面能的晶界驱动。

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