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首页> 外文期刊>Acta Materialia >Depth resolved conductive mode imaging of varistor grain boundaries
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Depth resolved conductive mode imaging of varistor grain boundaries

机译:压敏电阻晶界的深度分辨导电模式成像

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摘要

An SEM conductive mode method is described for estimating the angle a grain boundary makes with the specimen surface, by varying the beam energy. Application of this technique to sloping grain boundaries in zinc oxide eliminates grain boundary geometry as a cause for a certain type of conductive mode contrast that is incompatible with existing models for varistor behaviour. Factors responsible for this contrast are discussed. Estimation of the grain boundary declination is also of use in crystallographic stu- dies of interfaces in polycrystalline zinc oxide, enabling the grain boundary plane to be estimated and hence providing the necessary information for calculating the grain boundary structure without recourse to (destructive) sectioning techniques.
机译:描述了一种SEM传导模式方法,该方法通过改变束能量来估计晶界与样品表面的夹角。该技术在氧化锌中倾斜晶界的应用消除了晶界几何形状,这是导致某种类型的导电模式对比的原因,该导电模式对比与压敏电阻行为的现有模型不兼容。讨论了造成这种对比的因素。晶界偏角的估计也可用于多晶氧化锌界面的晶体学研究中,从而可以估计晶界平面,从而提供了无需借助(破坏性)切片技术即可计算晶界结构的必要信息。 。

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