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Electromagnetic interference in cardiac electronic implants caused by novel electrical appliances emitting electromagnetic fields in the intermediate frequency range: a systematic review

机译:由新型电子设备在中频范围内发射电磁场引起的心脏电子植入物中的电磁干扰:系统综述

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摘要

Electromagnetic fields (EMF) in the intermediate frequency (IF) range are generated by many novel electrical appliances, including electric vehicles, radiofrequency identification systems, induction hobs, or energy supply systems, such as wireless charging systems. The aim of this systematic review is to evaluate whether cardiovascular implantable electronic devices (CIEDs) are susceptible to electromagnetic interference (EMI) in the IF range (1 kHz–1 MHz). Additionally, we discuss the advantages and disadvantages of the different types of studies used to investigate EMI. Using the PRISMA (Preferred Reporting Items for Systematic Reviews and Meta-Analyses) statement, we collected and evaluated studies examining EMI in in vivo studies, in vitro studies (phantom studies, benchmark tests), and simulation studies. Our analysis revealed that cardiac implants are susceptible to malfunction induced by EMF in the IF range. Electromagnetic interference may in particular be provoked by security systems and induction hobs. The results of the studies evaluated in this systematic review further indicate that the likelihood for EMI is dependent on exposure-related parameters (field strength, frequency, and modulation) and on implant- as well as on lead-related parameters (model, type of implant, implant sensitivity setting, lead configuration, and implantation site). The review shows that the factors influencing EMI are not sufficiently characterized and EMF limit values for CIED patients cannot be derived yet. Future studies should therefore, consider exposure-related parameters as well as implant- and lead-related parameters systematically. Additionally, worst-case scenarios should be considered in all study types where possible.
机译:中频(IF)范围内的电磁场(EMF)由许多新型电器产生,包括电动车辆,射频识别系统,感应炉或能源供应系统,例如无线充电系统。本系统综述的目的是评估心血管植入式电子设备(CIED)在IF范围(1 kHz–1 MHz)中是否易受电磁干扰(EMI)的影响。此外,我们讨论了用于研究EMI的不同类型研究的优缺点。使用PRISMA(系统评价和荟萃分析的首选报告项目)陈述,我们收集并评估了在体内研究,体外研究(幻像研究,基准测试)和模拟研究中检查EMI的研究。我们的分析表明,心脏植入物易受中频范围内EMF引起的功能障碍的影响。电磁干扰尤其可能由安全系统和电磁炉引起。在此系统评价中评估的研究结果进一步表明,EMI的可能性取决于与暴露有关的参数(场强,频率和调制)以及与植入物有关的以及与铅有关的参数(模型,植入物,植入物灵敏度设置,导线配置和植入部位)。审查表明,影响EMI的因素尚未充分表征,CIED患者的EMF极限值尚无法得出。因此,未来的研究应系统地考虑与暴露相关的参数以及与植入物和铅相关的参数。此外,应尽可能在所有研究类型中考虑最坏情况。

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