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Role of Polymorphism and Thin-Film Morphology in OrganicSemiconductors Processed by Solution Shearing

机译:多态性和薄膜形态在有机物中的作用通过溶液剪切处理的半导体

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摘要

Organic semiconductors (OSCs) are promising materials for cost-effective production of electronic devices because they can be processed from solution employing high-throughput techniques. However, small-molecule OSCs are prone to structural modifications because of the presence of weak van der Waals intermolecular interactions. Hence, controlling the crystallization in these materials is pivotal to achieve high device reproducibility. In this perspective article, we focus on controlling polymorphism and morphology in small-molecule organic semiconducting thin films deposited by solution-shearing techniques compatible with roll-to-roll systems. Special attention is paid to the influence that the different experimental deposition parameters can have on thin films. Further, the main characterization techniques for thin-film structures are reviewed, highlighting the in situ characterization tools that can provide crucial insights into the crystallization mechanisms.
机译:有机半导体(OSC)是可用于经济有效地生产电子设备的有前途的材料,因为可以使用高通量技术从溶液中对其进行处理。但是,由于存在弱的范德华分子间相互作用,小分子OSC易于结构修饰。因此,控制这些材料中的结晶对于实现高设备重现性至关重要。在这篇有远见的文章中,我们集中于控制通过与卷对卷系统兼容的溶液剪切技术沉积的小分子有机半导体薄膜的多态性和形态。要特别注意不同的实验沉积参数对薄膜的影响。此外,对薄膜结构的主要表征技术进行了综述,重点介绍了可以为结晶机理提供重要见解的原位表征工具。

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