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Photodetection by Hot Electrons or Hot Holes: A ComparableStudy on Physics and Performances

机译:热电子或热孔的光电检测:可比物理与表演研究

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摘要

Hot-carrier photodetectors are drawing significant attention; nevertheless, current researches focus mostly on the hot-electron devices, which normally show low quantum efficiencies. In contrast, hot-hole photodetectors usually have lower barriers and can provide a wide spectral range of photodetection and an improved photoconversion efficiency. Here, we report a comparable study of the hot-electron and hot-hole photodetectors from both underlying physics and optoelectronic performance perspectives. Taking the typical Au/Si Schottky contact as an example, we find obvious differences in the energy band diagram and the sequent hot-carrier generation/transport/emission processes, leading to very distinguished photodetection performances. Compared with hot electrons, hot holes show higher density below the Fermi level, the longer mean free path arising under the lower electron–electron and electron–phonon scatterings, a lower barrier height, and a lighter effective mass in Si, all of which lead to larger number of high-energy hot holes, larger transport probability, higher emission efficiency, and higherphotoresponsivity. However, the low barrier height can cause poorperformances of hot-hole device in dark current density and detectivity.The study elucidates the intrinsic physical differences and comparesthe key performance parameters of the hot-hole and hot-electron photodetections,with the objective of providing complete information for designinghot-carrier devices.
机译:热载光电探测器引起了广泛关注。然而,当前的研究主要集中在通常显示出低量子效率的热电子器件上。相反,热孔光电检测器通常具有较低的势垒,并且可以提供较宽的光电检测光谱范围和更高的光电转换效率。在这里,我们从基础物理和光电性能的角度报告了对热电子和热孔光电探测器的可比研究。以典型的Au / Si肖特基接触为例,我们发现能带图和随后的热载流子产生/传输/发射过程存在明显的差异,从而导致非常出色的光电检测性能。与热电子相比,热空穴在费米能级以下显示出更高的密度,在较低的电子-电子和电子-声子散射下产生的平均自由程更长,势垒高度较低,并且Si中的有效质量更轻,所有这些都导致到更多的高能热孔,更大的传输概率,更高的发射效率以及更高的效率光响应性。但是,低的栅栏高度会导致不良热孔器件在暗电流密度和探测率方面的性能该研究阐明了内在的物理差异并进行了比较热空穴和热电子光电检测的关键性能参数,目的是为设计提供完整的信息热载设备。

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