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High-resolution spectral information enables phenotyping of leaf epicuticular wax in wheat

机译:高分辨率光谱信息使小麦的叶片侵占性蜡的表型化

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摘要

Variation in a absorbance, b transmittance and c reflectance derived by the removal of the EW coat with HPLC chloroform (CHCl3). These variations are presented as the difference of the spectral signature of the leaf after the wax coat was removed minus the the spectral response of the leaf with the wax coat in place. The red solid lines define the red edge and the dash line mark the end of the visible and start of the NIR region. The slope of the linear regression models (d) were fitted as Y = a + bX, where Y corresponds to the independent variable EW (mg·dm−2), X is the percentage of light reflectance at one nanometer resolution, a and b are the intercept and the slope of the fitted model, respectively. The statistical significance of the models was P≤0.05 or less
机译:通过用HPLC氯仿(CHCl3)除去EW涂层的吸光度,B透射率和C反射率的变化。在除去蜡涂层之后,将这些变化作为叶片的光谱特征的差异减去蜡涂层的叶片的光谱响应。红色实线定义红色边缘和虚线标记末端和NIR区域的末端。线性回归模型(d)的斜率被装配为y = a + bx,其中Y对应于独立变量Ew(mg·dm-2),x是一个纳米分辨率,a和b处的光反射率的百分比是分别截取和拟合模型的斜率。模型的统计学意义是p≤0.05或更低

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