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Light‐Driven WSe2‐ZnO Junction Field‐Effect Transistors for High‐Performance Photodetection

机译:WSe2-ZnO光驱动结型场效应晶体管用于高性能光电检测

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摘要

Assembling nanomaterials into hybrid structures provides a promising and flexible route to reach ultrahigh responsivity by introducing a trap‐assisted gain ( ) mechanism. However, the high‐gain photodetectors benefitting from long carrier lifetime often possess slow response time ( ) due to the inherent – tradeoff. Here, a light‐driven junction field‐effect transistor (LJFET), consisting of an n‐type ZnO belt as the channel material and a p‐type WSe nanosheet as a photoactive gate material, to break the – tradeoff through decoupling the gain from carrier lifetime is reported. The photoactive gate material WSe under illumination enables a conductive path for externally applied voltage, which modulates the depletion region within the ZnO channel efficiently. The gain and response time are separately determined by the field effect modulation and the switching speed of LJFET. As a result, a high responsivity of 4.83 × 10 A W with a gain of ≈10 and a rapid response time of ≈10 µs are obtained simultaneously. The LJFET architecture offers a new approach to realize high‐gain and fast‐response photodetectors without the – tradeoff.
机译:通过引入陷阱辅助增益()机制,将纳米材料组装到混合结构中可提供一种有希望且灵活的途径来实现超高响应度。但是,受益于较长载流子寿命的高增益光电探测器由于固有的权衡因素,通常具有较慢的响应时间()。在这里,一个光驱动结型场效应晶体管(LJFET)由n型ZnO带作为沟道材料和ap型WSe纳米片作为光敏栅极材料组成,通过将增益与载流子解耦来打破–折衷。报告寿命。光照下的光敏栅极材料WSe可以为外部施加的电压提供导电路径,从而有效地调制ZnO通道内的耗尽区。增益和响应时间由场效应调制和LJFET的开关速度分别确定。结果,同时获得了4.83×10 A W的高响应度,≈10的增益和≈10µs的快速响应时间。 LJFET架构提供了一种无需折衷即可实现高增益和快速响应光电探测器的新方法。

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