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Simulation of light transport in scintillators based on 3D characterization of crystal surfaces

机译:基于晶体表面的3D表征闪烁仪光传输的仿真

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摘要

In the development of positron emission tomography (PET) detectors, understanding and optimizing scintillator light collection is critical for achieving high performance, particularly when the design incorporates depth-of-interaction (DOI) encoding or time-of-flight information. Monte-Carlo simulations play an important role in guiding research in detector designs and popular software such as GATE now include models of light transport in scintillators. Although current simulation toolkits are able to provide accurate models of perfectly polished surfaces, they do not successfully predict light output for other surface finishes, for example those often used in DOI-encoding detectors. The lack of accuracy of those models mainly originates from a simplified description of rough surfaces as an ensemble of micro-facets determined by the distribution of their normal, typically a Gaussian distribution. The user can specify the standard deviation of this distribution, but this parameter does not provide a full description of the surface reflectance properties. We propose a different approach based on 3D measurements of the surface using atomic force microscopy (AFM). Polished and rough (unpolished) crystals were scanned to compute the surface reflectance properties. The angular distributions of reflectance and reflected rays were computed and stored in look-up tables (LUTs). The LUTs account for the effect of incidence angle and were integrated in a light transport model. Crystals of different sizes were simulated with and without reflector. The simulated maximum light output and the light output as a function of DOI showed very good agreement with experimental characterization of the crystals, indicating that our approach provides an accurate model of polished and rough surfaces and could be used to predict light collection in scintillators. This model is based on a true 3D representation of the surface, makes no assumption about the surface and provides insight on the optical behaviour of rough crystals that can play a critical role in optimizing the design of PET detectors. This approach is also compatible with existing simulation toolkits and next steps include the implementation in GATE.
机译:在正电子发射断层扫描(PET)检测器的开发中,了解和优化闪烁体的光收集对于实现高性能至关重要,尤其是当该设计结合了交互深度(DOI)编码或飞行时间信息时。蒙特卡洛模拟在指导检测器设计研究中起着重要作用,流行的软件(如GATE)现在包括闪烁体中的光传输模型。尽管当前的仿真工具包能够提供完美抛光表面的精确模型,但它们无法成功预测其他表面光洁度的光输出,例如DOI编码检测器中经常使用的光输出。这些模型缺乏准确性,主要是由于粗糙表面的简化描述,因为粗糙表面是由其法线分布(通常是高斯分布)确定的微面的整体。用户可以指定此分布的标准偏差,但是此参数不能提供对表面反射率特性的完整描述。我们基于使用原子力显微镜(AFM)对表面进行3D测量的方法,提出了一种不同的方法。扫描抛光和粗糙(未抛光)的晶体以计算表面反射率特性。计算反射率和反射光线的角度分布,并将其存储在查找表(LUT)中。 LUT解释了入射角的影响,并被集成到光传输模型中。在有和没有反射镜的情况下,模拟了不同大小的晶体。模拟的最大光输出和作为DOI的函数的光输出与晶体的实验表征非常吻合,这表明我们的方法提供了抛光和粗糙表面的准确模型,可用于预测闪烁体中的光收集。该模型基于表面的真实3D表示,不对表面做任何假设,并提供了对粗糙晶体的光学行为的洞察力,这些晶体可以在优化PET检测器的设计中发挥关键作用。这种方法也与现有的仿真工具包兼容,下一步包括在GATE中的实现。

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