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Slow Inactivation Does Not Block the Aqueous Accessibility to the Outer Pore of Voltage-gated Na Channels

机译:缓慢的灭活不会阻止水进入可控门控Na通道的外部孔

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摘要

Slow inactivation of voltage-gated Na channels is kinetically and structurally distinct from fast inactivation. Whereas structures that participate in fast inactivation are well described and include the cytoplasmic III-IV linker, the nature and location of the slow inactivation gating mechanism remains poorly understood. Several lines of evidence suggest that the pore regions (P-regions) are important contributors to slow inactivation gating. This has led to the proposal that a collapse of the pore impedes Na current during slow inactivation. We sought to determine whether such a slow inactivation-coupled conformational change could be detected in the outer pore. To accomplish this, we used a rapid perfusion technique to measure reaction rates between cysteine-substituted side chains lining the aqueous pore and the charged sulfhydryl-modifying reagent MTS-ET. A pattern of incrementally slower reaction rates was observed at substituted sites at increasing depth in the pore. We found no state-dependent change in modification rates of P-region residues located in all four domains, and thus no change in aqueous accessibility, between slow- and nonslow-inactivated states. In domains I and IV, it was possible to measure modification rates at residues adjacent to the narrow DEKA selectivity filter (Y401C and G1530C), and yet no change was observed in accessibility in either slow- or nonslow-inactivated states. We interpret these results as evidence that the outer mouth of the Na pore remains open while the channel is slow inactivated.
机译:电压门控Na通道的缓慢失活在动力学和结构上不同于快速失活。尽管参与快速灭活的结构已得到很好的描述,包括细胞质III-IV连接子,但缓慢灭活门控机制的性质和位置仍然知之甚少。几条证据表明,孔区域(P区)是导致失活选通缓慢的重要因素。这导致了这样的提议,即孔的破裂在缓慢的失活期间阻碍了钠电流。我们试图确定是否可以在外孔中检测到这种缓慢的失活偶联构象变化。为此,我们使用了快速灌注技术来测量衬在水孔内的半胱氨酸取代的侧链与带电的巯基修饰剂MTS-ET之间的反应速率。在孔中深度增加的取代位点观察到反应速率逐渐降低的模式。我们发现慢速和非慢速灭活状态之间位于所有四个域中的P区残基的修饰率没有依赖于状态的变化,因此水可及性也没有变化。在域I和IV中,可以测量与窄DEKA选择性滤光片(Y401C和G1530C)相邻的残基的修饰率,但在慢速灭活或非慢速灭活状态下,可及性均未观察到变化。我们将这些结果解释为Na孔的外口保持张开而通道缓慢失活的证据。

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