Numerical Modeling of Silicon Photodiodes for High-Accuracy Applications Part III: Interpolating and Extrapolating Internal Quantum-Efficiency Calibrations

摘要

The semiconductor device modeling program PC-ID and the programs that support its use in high-accuracy modeling of photodiodes, all of which were described in Part I of this series of papers, are used to simulate the interpolation of high-accuracy internal quantum-efficiency calibrations in the spectral region between 450 nm and 850 nm. Convenient interpolation formulae that depend only upon wavelength are derived. Uncertainty spectra for a number of sources of error are also derived. The formulae are normalized to experimental internal-quantum efficiency calibrations in the 440 to 470 nm spectral region and at 860 nm and arc used to interpolate the calibration values between these wavelengths. The results of the interpolations are compared with experimental calibration data that are available at a few wavelengths between 440 and 860 nm. The disagreement between the interpolated and measured internal quantum-efficiency data is never worse than 0.0003.