首页> 美国卫生研究院文献>Chemical Science >Highly reversible potassium-ion intercalation in tungsten disulfide
【2h】

Highly reversible potassium-ion intercalation in tungsten disulfide

机译:二硫化钨中高度可逆的钾离子嵌入

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

Rechargeable potassium-ion batteries (PIBs) show promise beyond Li-ion technology in large-scale electrical-energy storage due to the abundance and low cost of potassium resources. However, the intercalation of large-size K+ generally results in irreversible structural degradation and short lifespan to the hosts, representing a major obstacle. Here, we report a new electrochemical K+-intercalation host, tungsten disulfide (WS2), which can store 0.62 K+ per formula unit with a reversible capacity of 67 mA h g–1 and well-defined voltage plateaus at an intrinsically safe average operation potential of 0.72 V versus K/K+. In situ X-ray diffraction and ex situ electron microscopy revealed the underlying intercalation mechanism, a relatively small cell volume change (37.81%), and high reversibility of this new battery chemistry. Such characteristics impart WS2 with ultrahigh structural stability and a long lifespan, regardless of deep or fast charging. WS2 achieved record-high cyclability among chalcogenides up to 600 cycles with 89.2% capacity retention at 0.3C, and over 1000 cycles with 96.3% capacity retention and an extraordinary average Coulombic efficiency of 99.90% at 2.2C. This intercalation electrochemistry may open up new opportunities for the design of long-cycle-life and high-safety PIBs.
机译:可充电的钾离子电池(PIB)由于钾资源丰富且成本低廉,因此在大规模电能存储中显示出超越锂离子技术的希望。然而,大尺寸K + 的插入通常会导致不可逆的结构退化和对主体的短寿命,这是一个主要障碍。在这里,我们报告了一种新的电化学K + 插层主体,二硫化钨(WS2),每个配方单元可存储0.62 K + ,可逆容量为67 mA hg相对于K / K + 的本安平均电势为 –1 和良好定义的电压平稳状态。原位X射线衍射和非原位电子显微镜揭示了潜在的嵌入机制,相对较小的电池体积变化(37.81%)和这种新电池化学的高度可逆性。不管深度充电还是快速充电,这种特性都为WS2提供了超高的结构稳定性和长的使用寿命。 WS2的硫族化物在0.3C时最多可循环600次,容量保持率达到89.2%,在1000个循环中达到96.3%的容量保持率,在2.2℃时具有99.90%的平均库仑效率,实现了创纪录的高循环性。这种插层电化学可能为设计长寿命和高安全性的PIB开辟新的机会。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号