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Probing nanocrystalline grain dynamics in nanodevices

机译:探索纳米器件中的纳米晶粒动力学

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摘要

Dynamical structural defects exist naturally in a wide variety of solids. They fluctuate temporally and hence can deteriorate the performance of many electronic devices. Thus far, the entities of these dynamic objects have been identified to be individual atoms. On the other hand, it is a long-standing question whether a nanocrystalline grain constituted of a large number of atoms can switch, as a whole, reversibly like a dynamical atomic defect (that is, a two-level system). This is an emergent issue considering the current development of nanodevices with ultralow electrical noise, qubits with long quantum coherence time, and nanoelectromechanical system sensors with ultrahigh resolution. We demonstrate experimental observations of dynamic nanocrystalline grains that repeatedly switch between two or more metastable coordinate states. We study temporal resistance fluctuations in thin ruthenium dioxide (RuO2) metal nanowires and extract microscopic parameters, including relaxation time scales, mobile grain sizes, and the bonding strengths of nanograin boundaries. These material parameters are not obtainable by other experimental approaches. When combined with previous in situ high-resolution transmission electron microscopy, our electrical method can be used to infer rich information about the structural dynamics of a wide variety of nanodevices and new two-dimensional materials.
机译:动态结构缺陷自然存在于各种固体中。它们会随时间波动,因此可能会使许多电子设备的性能下降。到目前为止,这些动态物体的实体已被确定为单个原子。另一方面,由大量原子构成的纳米晶粒整体上是否能够像动态原子缺陷(即两级体系)那样可逆地转换,这是一个长期存在的问题。考虑到当前开发的具有超低电噪声的纳米器件,具有长量子相干时间的量子比特以及具有超高分辨率的纳米机电系统传感器,这是一个紧急问题。我们展示了动态的纳米晶粒的实验观察结果,该晶粒在两个或多个亚稳态坐标状态之间反复切换。我们研究了二氧化钌(RuO2)金属纳米线的时间电阻波动,并提取了微观参数,包括弛豫时间尺度,移动晶粒尺寸和纳米晶粒边界的结合强度。这些材料参数无法通过其他实验方法获得。当与以前的原位高分辨率透射电子显微镜结合使用时,我们的电学方法可用于推断有关各种纳米器件和新型二维材料的结构动力学的丰富信息。

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