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Observation of femtosecond X-ray interactions with matter using an X-ray–X-ray pump–probe scheme

机译:使用X射线X射线泵浦探针方案观察飞秒X射线与物质的相互作用

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摘要

Resolution in the X-ray structure determination of noncrystalline samples has been limited to several tens of nanometers, because deep X-ray irradiation required for enhanced resolution causes radiation damage to samples. However, theoretical studies predict that the femtosecond (fs) durations of X-ray free-electron laser (XFEL) pulses make it possible to record scattering signals before the initiation of X-ray damage processes; thus, an ultraintense X-ray beam can be used beyond the conventional limit of radiation dose. Here, we verify this scenario by directly observing femtosecond X-ray damage processes in diamond irradiated with extraordinarily intense (∼1019 W/cm2) XFEL pulses. An X-ray pump–probe diffraction scheme was developed in this study; tightly focused double–5-fs XFEL pulses with time separations ranging from sub-fs to 80 fs were used to excite (i.e., pump) the diamond and characterize (i.e., probe) the temporal changes of the crystalline structures through Bragg reflection. It was found that the pump and probe diffraction intensities remain almost constant for shorter time separations of the double pulse, whereas the probe diffraction intensities decreased after 20 fs following pump pulse irradiation due to the X-ray–induced atomic displacement. This result indicates that sub-10-fs XFEL pulses enable conductions of damageless structural determinations and supports the validity of the theoretical predictions of ultraintense X-ray–matter interactions. The X-ray pump–probe scheme demonstrated here would be effective for understanding ultraintense X-ray–matter interactions, which will greatly stimulate advanced XFEL applications, such as atomic structure determination of a single molecule and generation of exotic matters with high energy densities.
机译:非晶态样品在X射线结构测定中的分辨率已被限制在几十纳米,因为增强分辨率所需的深X射线辐射会对样品造成辐射损伤。但是,理论研究预测,X射线自由电子激光(XFEL)脉冲的飞秒(fs)持续时间使在X射线破坏过程开始之前记录散射信号成为可能。因此,可以使用超出常规辐射剂量限制的超强X射线束。在这里,我们通过直接观察用超强(〜10 19 W / cm 2 )XFEL脉冲辐照的钻石中飞秒X射线损伤过程来验证这种情况。在这项研究中开发了X射线泵-探针衍射方案。时间间隔范围从亚fs到80 fs的紧密聚焦的double-5-fs XFEL脉冲用于激发(即泵浦)金刚石并通过布拉格反射表征(即探测)晶体结构的时间变化。结果发现,对于双脉冲的更短时间分离,泵浦和探针的衍射强度几乎保持不变,而泵浦脉冲照射后20 fs后,由于X射线引起的原子位移,探头的衍射强度降低。这一结果表明,亚-10-fs XFEL脉冲可以进行无损结构确定,并支持超强X射线物质相互作用的理论预测的有效性。此处展示的X射线泵浦探针方案将有效地理解超强X射线物质相互作用,这将极大地刺激先进的XFEL应用,例如确定单个分子的原子结构以及产生具有高能量密度的奇异物质。

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