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Quantum enhancement of accuracy and precision in optical interferometry

机译:光学干涉仪中量子精度和精确度的提高

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摘要

White-light interferometry is one of today’s most precise tools for determining the properties of optical materials. Its achievable precision and accuracy are typically limited by systematic errors due to a high number of interdependent data-fitting parameters. Here, we introduce spectrally resolved quantum white-light interferometry as a novel tool for optical property measurements, notably, chromatic dispersion in optical fibres. By exploiting both spectral and photon-number correlations of energy-time entangled photon pairs, the number of fitting parameters is significantly reduced, which eliminates systematic errors and leads to an absolute determination of the material parameter. By comparing the quantum method to state-of-the-art approaches, we demonstrate the quantum advantage of 2.4 times better measurement precision, despite requiring 62 times fewer photons. The improved results are due to conceptual advantages enabled by quantum optics, which are likely to define new standards in experimental methods for characterising optical materials.
机译:白光干涉测量法是当今用于确定光学材料特性的最精确工具之一。由于大量相互依赖的数据拟合参数,其可实现的精度和准确性通常受到系统误差的限制。在这里,我们介绍光谱分辨量子白光干涉测量法,将其作为光学性能测量的新工具,特别是光纤中的色散。通过利用能量时间纠缠的光子对的光谱和光子数相关性,显着减少了拟合参数的数量,这消除了系统误差并导致对材料参数的绝对确定。通过将量子方法与最先进的方法进行比较,我们证明了尽管需要的光子数量减少了62倍,但测量精度提高了2.4倍。改进的结果归因于量子光学技术的概念优势,这可能会在表征光学材料的实验方法中定义新的标准。

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