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Development of a seedling inoculation technique for rapid evaluation of soybean for resistance to Phomopsis longicolla under controlled conditions

机译:开发可快速在控制条件下评价大豆对长柄拟南芥抗性的接种苗技术

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摘要

BackgroundPhomopsis seed decay (PSD) of soybean (Glycine max L. Merr.) is caused primarily by the seed-borne fungal pathogen Phomopsis longicolla T. W. Hobbs. The PSD disease reduces seed quality and yield worldwide. Development of effective techniques to evaluate soybean for resistance to PSD can facilitate identification of new sources of host resistance to manage the disease. This study was undertaken to develop and utilize a rapid cut-seedling inoculation technique to evaluate soybean genotypes for resistance to P. longicolla under controlled conditions.
机译:背景技术大豆(Glycine max L. Merr。)的磷虫种子腐烂(PSD)主要是由种子传播的真菌病原体Phomopsis longicolla T. W. Hobbs引起的。 PSD病害降低了全世界的种子质量和产量。评估大豆对PSD的抗性的有效技术的开发可以促进对宿主抗药性的新来源的识别,以控制该病。进行这项研究是为了开发和利用快速切苗接种技术来评估大豆基因型在受控条件下对P. longicolla的抗性。

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