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Mapping Synaptic Pathology within Cerebral Cortical Circuits in Subjects with Schizophrenia

机译:精神分裂症患者大脑皮质回路内的突触病理学定位

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摘要

Converging lines of evidence indicate that schizophrenia is characterized by impairments of synaptic machinery within cerebral cortical circuits. Efforts to localize these alterations in brain tissue from subjects with schizophrenia have frequently been limited to the quantification of structures that are non-selectively identified (e.g., dendritic spines labeled in Golgi preparations, axon boutons labeled with synaptophysin), or to quantification of proteins using methods unable to resolve relevant cellular compartments. Multiple label fluorescence confocal microscopy represents a means to circumvent many of these limitations, by concurrently extracting information regarding the number, morphology, and relative protein content of synaptic structures. An important adaptation required for studies of human disease is coupling this approach to stereologic methods for systematic random sampling of relevant brain regions. In this review article we consider the application of multiple label fluorescence confocal microscopy to the mapping of synaptic alterations in subjects with schizophrenia and describe the application of a novel, readily automated, iterative intensity/morphological segmentation algorithm for the extraction of information regarding synaptic structure number, size, and relative protein level from tissue sections obtained using unbiased stereological principles of sampling. In this context, we provide examples of the examination of pre- and post-synaptic structures within excitatory and inhibitory circuits of the cerebral cortex.
机译:越来越多的证据表明,精神分裂症的特征是大脑皮质回路中的突触机械受损。定位精神分裂症患者大脑组织中这些变化的努力通常仅限于对非选择性鉴定的结构进行定量(例如,在高尔基体中标记的树突棘,在突触素中标记的轴突突突),或使用方法无法解决相关的细胞室。多标记荧光共聚焦显微镜是通过同时提取有关突触结构的数量,形态和相对蛋白含量的信息来规避许多这些局限性的手段。研究人类疾病所需的一项重要适应措施是将该方法与用于对相关脑区域进行系统随机采样的立体方法相结合。在这篇综述文章中,我们考虑了多标记荧光共聚焦显微镜在精神分裂症患者突触变化定位中的应用,并描述了一种新颖,易于自动化的迭代强度/形态学分割算法在提取有关突触结构编号信息中的应用。 ,大小和相对蛋白质水平,取自采用无偏立体学原理采样的组织切片。在这种情况下,我们提供了检查大脑皮层的兴奋性和抑制性电路内突触前和突触后结构的示例。

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