Contrast enhancement of surface layers with fast middle-infrared scanning

摘要

In this study, we present an efficient and innovative method to visualize absorption differences in the mid-infrared range with spatial resolution using laser technology. We focus on only two lasers with wavelengths between 3.4 μm and 3.6 μm and a spatial resolution of 20 μm and thus achieve a scanning speed up to 300 kS/s for fast image generation. In this article, we focus especially on the detection of C–H bands in this region of the absorption spectrum. Concealed structures are examined by calculating the measured structures with both wavelengths. In our results, we demonstrate exemplary measurements on 130-μm-thick polyvinyl chloride layers. In turn, these structures are suitable for further processing in rapid quantitative quality control.