Magnetoelectric Force Microscopy on Antiferromagnetic 180∘ Domains in Cr2O3

摘要

Magnetoelectric force microscopy (MeFM) is characterized as methodical tool for the investigation of antiferromagnetic domain states, in particular of the 180^∘ variety. As reference compound for this investigation we use Cr2O3. Access to the antiferromagnetic order is provided by the linear magnetoelectric effect. We resolve the opposite antiferromagnetic 180^∘ domain states of Cr2O3 and estimate the sensitivity of the MeFM approach, its inherent advantages in comparison to alternative techniques and its general feasibility for probing antiferromagnetic order.