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Investigation of Electric Field–Induced Structural Changes at Fe-Doped SrTiO3 Anode Interfaces by Second Harmonic Generation

机译:二次谐波生成研究掺铁SrTiO3阳极界面上电场引起的结构变化

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摘要

We report on the detection of electric field–induced second harmonic generation (EFISHG) from the anode interfaces of reduced and oxidized Fe-doped SrTiO3 (Fe:STO) single crystals. For the reduced crystal, we observe steady enhancements of the susceptibility components as the imposed dc-voltage increases. The enhancements are attributed to a field-stabilized electrostriction, leading to Fe:Ti-O bond stretching and bending in Fe:Ti-O6 octahedra. For the oxidized crystal, no obvious structural changes are observed below 16 kV/cm. Above 16 kV/cm, a sharp enhancement of the susceptibilities occurs due to local electrostrictive deformations in response to oxygen vacancy migrations away from the anode. Differences between the reduced and oxidized crystals are explained by their relative oxygen vacancy and free carrier concentrations which alter internal electric fields present at the Pt/Fe:STO interfaces. Our results show that the optical SHG technique is a powerful tool for detecting structural changes near perovskite-based oxide interfaces due to field-driven oxygen vacancy migration.
机译:我们报告了从还原和氧化的Fe掺杂SrTiO3(Fe:STO)单晶的阳极界面检测电场引起的二次谐波(EFISHG)的过程。对于还原的晶体,随着施加的直流电压的增加,我们观察到磁化率成分稳定增加。增强归因于场稳定的电致伸缩,导致Fe:Ti-O6八面体中的Fe:Ti-O键拉伸和弯曲。对于氧化的晶体,在16kV / cm以下观察不到明显的结构变化。高于16 kV / cm,由于响应于氧空位迁移离开阳极而引起的局部电致伸缩变形,磁化率会急剧提高。还原和氧化晶体之间的差异由它们的相对氧空位和自由载流子浓度来解释,它们改变了Pt / Fe:STO界面上存在的内部电场。我们的结果表明,光学SHG技术是检测由于电场驱动的氧空位迁移而导致的钙钛矿基氧化物界面附近结构变化的强大工具。

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