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IndiumTin Oxide Nanowire Networks as Effective UV/VisPhotodetection Platforms

机译:铟氧化锡纳米线网络作为有效的UV / Vis光电检测平台

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摘要

We demonstrate that indium tin oxide nanowires (ITO NWs) and cationic polymer-modified ITO NWs configured in a network format can be used as high performing UV/vis photodetectors. The photovoltage response of ITO NWs is much higher than similarly constructed devices made from tin oxide, zinc tin oxide, and zinc oxide nanostructures. The ITO NW mesh-based devices exhibit a substantial photovoltage (31–100 mV under illumination with a 1.14 mW 543 nm laser) and photocurrent (225–325 μA at 3 V). The response time of the devices is fast with a rise time of 20–30 μs and a decay time of 1.5–3.7 ms when probed with a 355 nm pulsed laser. The photoresponsivity of the ITO NW devices ranges from 0.07 to 0.2 A/W at a 3 V bias, whose values are in the performance range of most commercial UV/vis photodetectors. Such useful photodetector characteristics from our ITO NW mesh devices are attained straightforwardly without the need for complicated fabrication procedures involving highly specialized lithographic tools. Therefore, our approach of ITO NW network-based photodetectors can serve as aconvenient alternative to commercial or single NW-based devices.
机译:我们证明,以网络格式配置的铟锡氧化物纳米线(ITO NW)和阳离子聚合物改性的ITO NW可用作高性能UV / vis光电探测器。 ITO NW的光电压响应远远高于由氧化锡,氧化锌锡和氧化锌纳米结构制成的类似构造的器件。基于ITO NW网状器件的器件具有很大的光电压(在1.14 mW 543 nm激光照射下为31–100 mV)和光电流(在3 V时为225–325μA)。当用355 nm脉冲激光器探测时,器件的响应时间很快,上升时间为20–30μs,衰减时间为1.5–3.7 ms。 ITO NW器件在3 V偏压下的光响应度范围为0.07至0.2 A / W,其值在大多数商用UV / vis光电探测器的性能范围内。通过我们的ITO NW网格设备可轻松获得这种有用的光电检测器特性,而无需复杂的制造过程(包括高度专业的光刻工具)。因此,我们基于ITO NW网络的光电探测器的方法可以用作是商用或单个基于NW的设备的便捷替代方案。

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