TDC-GP1器件单粒子锁定效应的脉冲激光模拟试验研究

摘要

文章介绍了单粒子锁定效应脉冲激光模拟试验的工作原理。以时间测量芯片TDC-GP1为试验对象，利用单粒子锁定模拟试验设备开展了无限流保护电阻和有限流保护电阻的单粒子锁定效应脉冲激光模拟试验研究。结果发现：TCD-GP1芯片在20 nJ脉冲激光辐照下发生了单粒子锁定现象。在对照试验中发现，有限流保护电阻的情况下，在发生锁定时不仅能降低锁定大电流和供电电压，而且还能有效地避免器件的功能损伤。%The working principles of the pulsed laser simulation to study the SEL (single event latch-up) effects are discussed in this paper. With the TDC-GP1 chip as an example, the pulsed laser simulation tests for the SEL are carried out on the SEL simulation test facility, including the SEL simulation tests with and without the current-limiting resistance. It is shown that the SEL occurs while the TDC-GP1 is irradiated by a 20 nJ pulsed laser. In the contrast tests, it is found that the SEL simulation test with the current-limiting resistance not only reduces the SEL current and voltage, but also effectively protects the TDC-GP1 chip from damages.