采用期间核查和质量控制的方法,是为了验证和确保低本底半导体γ 谱仪工作性能的稳定和可靠,保证检测数据的质量和准确.使用低本底高纯锗γ 谱仪GR8023,用不同的标准源测试其分辨力、短期稳定性、效率和活度,与 JJG417-2006 中对半导体γ 谱仪的计量性能指标进行对比;测量10 ～ 20 次相同时间间隔的本底计数,进行泊松分布检验,对一年内该仪器的本底计数和对同一标准源的探测效率进行统计,分别绘制本底和探测效率长期稳定性质量控制图.低本底高纯锗γ 谱仪GR8023 的主要计量指标满足要求,短期稳定性满足泊松分布,本底计数率和探测效率测量值均落在质量控制图的警戒线内.在一个检定周期内,低本底高纯锗γ 谱仪GR8023 的期间核查结果合格,短期稳定性和长期稳定性满足要求,仪器工作稳定,满足检测工作需要.%The objective of using the method of period verification and quality control is to verify and ensure the stability and reliability of the low background semiconductor gamma spectrometer and then to make sure the quality and accuracy of the test data. In this study, the resolution, short-term stability, efficiency and activity of the low-background high-purity germanium gamma spectrometer GR8023 are tested with different standard sources, and the measurement performance of GR8023 is compared to that of the semiconductor gamma spectrometer specified in JJG417-2006. 10 to 20 times background counts at the same time interval are measured for Poisson distribution test. The background count and the detection efficiency of the same standard source of the instrument for one yearare counted, and the quality control charts of the background andlong-term stability of the detection efficiency are plotted respectively. The results showed thatthe main measurement indexes of the low-background high-purity germanium gamma spectrometer GR8023 meet the requirements. The short-term stability is in compliance with the Poisson distribution, and the background count rate and detection efficiency measurement values are all within the warning scope of the quality control chart. During a verification period, the period verificationresults of the low-background high-purity germanium gamma spectrometer GR8023 are qualified. The short-term and long-term stability both meet the requirements. The instrument is stable and meets the requirements of the test work.
展开▼
