首页> 中文期刊> 《半导体光子学与技术:英文版》 >Analysis on Additional Crosstalk Caused by Oblique Incident Ray on PIN Detector Array

Analysis on Additional Crosstalk Caused by Oblique Incident Ray on PIN Detector Array

             

摘要

The crosstalk caused by oblique incident ray on a PIN detector array is analyzed. An integral expression of crosstalk factor in relation to incident angle and structure parameters is deduced and the correctness of the deduction is tested and verified.

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