首页> 外文期刊>半导体光子学与技术(英文版) >3D Surface Morphology Measurement and Auto-focusing System
【24h】

3D Surface Morphology Measurement and Auto-focusing System

机译:3D表面形态测量和自动聚焦系统

获取原文
获取原文并翻译 | 示例
       

摘要

When interference microscope measures the surface rough of the micromechanical device, as soon as the work distance of interference microscope and the depth of field is shortened, the interference images become slur for the measured object if there has small interference after clear focus. The auto-focusing system is introduced into the interference microscope, the system can obtain high definition interference image rapidly,and can improve the measuring velocity and measuring precision. The system is characterized by auto-focusing range of ±150 μm, auto-focusing precision of ±0.3 μm, auto-focusing time of 4~8 s.
机译:当干涉显微镜测量微机械装置的表面粗糙度时,一旦干涉显微镜的工作距离和景深变短,在清晰聚焦后如果干涉很小,则干涉图像对于被测物体会变得模糊不清。将自动调焦系统引入干涉显微镜,可以快速获取高清干涉图像,提高了测量速度和测量精度。该系统的特点是自动聚焦范围为±150μm,自动聚焦精度为±0.3μm,自动聚焦时间为4〜8 s。

著录项

获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号