The 2-axis stress component decoupling of {100} c-Si by using oblique backscattering micro-Raman spectroscopy

著录项

• 来源
  《中国科学:物理学 力学 天文学（英文版）》 |2020年第9期|51-57|共7页
• 作者

  DongHui Fu; XiaoYong He; LuLu Ma; HuaDan Xing; Tian Meng; Ying Chang; Wei Qiu;

  展开▼
• 作者单位

  Tianjin Key Laboratory of Modern Engineering Mechanics Department of Mechanics Tianjin University Tianjin 300350 China;

  Tianjin Key Laboratory of Modern Engineering Mechanics Department of Mechanics Tianjin University Tianjin 300350 China;

  Tianjin Key Laboratory of Modern Engineering Mechanics Department of Mechanics Tianjin University Tianjin 300350 China;

  Department of Mechanical Engineering Lamar University Beaumont TX 77710 USA;

  Tianjin Key Laboratory of Modern Engineering Mechanics Department of Mechanics Tianjin University Tianjin 300350 China;

  Department of Electrical and Computer Engineering University of Delaware Newark DE 19711 USA;

  Tianjin Key Laboratory of Modern Engineering Mechanics Department of Mechanics Tianjin University Tianjin 300350 China;

  Tianjin Key Laboratory of Modern Engineering Mechanics Department of Mechanics Tianjin University Tianjin 300350 China;

  Tianjin Key Laboratory of Modern Engineering Mechanics Department of Mechanics Tianjin University Tianjin 300350 China;

  Department of Mechanical Engineering Lamar University Beaumont TX 77710 USA;

  展开▼
• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词