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Temperature dependence of the point defect properties of GaN thin films studied by terahertz time-domain spectroscopy

机译:通过Terahertz时域光谱研究的GaN薄膜点缺陷性能的温度依赖性

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    Jiangsu Provincial Key Laboratory of Advanced Photonic and Electronic Materials School of Electronics Science and Engineering Nanjing National Laboratory of Microstructure Nanjing University Nanjing 210093 China;

    Jiangsu Provincial Key Laboratory of Advanced Photonic and Electronic Materials School of Electronics Science and Engineering Nanjing National Laboratory of Microstructure Nanjing University Nanjing 210093 China;

    Jiangsu Provincial Key Laboratory of Advanced Photonic and Electronic Materials School of Electronics Science and Engineering Nanjing National Laboratory of Microstructure Nanjing University Nanjing 210093 China;

    Jiangsu Provincial Key Laboratory of Advanced Photonic and Electronic Materials School of Electronics Science and Engineering Nanjing National Laboratory of Microstructure Nanjing University Nanjing 210093 China;

    Jiangsu Provincial Key Laboratory of Advanced Photonic and Electronic Materials School of Electronics Science and Engineering Nanjing National Laboratory of Microstructure Nanjing University Nanjing 210093 China;

    Jiangsu Provincial Key Laboratory of Advanced Photonic and Electronic Materials School of Electronics Science and Engineering Nanjing National Laboratory of Microstructure Nanjing University Nanjing 210093 China;

    Jiangsu Provincial Key Laboratory of Advanced Photonic and Electronic Materials School of Electronics Science and Engineering Nanjing National Laboratory of Microstructure Nanjing University Nanjing 210093 China;

  • 收录信息 北京大学中文核心期刊目录(北大核心);
  • 原文格式 PDF
  • 正文语种 eng
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