机译:通过Terahertz时域光谱研究的GaN薄膜点缺陷性能的温度依赖性
Jiangsu Provincial Key Laboratory of Advanced Photonic and Electronic Materials School of Electronics Science and Engineering Nanjing National Laboratory of Microstructure Nanjing University Nanjing 210093 China;
Jiangsu Provincial Key Laboratory of Advanced Photonic and Electronic Materials School of Electronics Science and Engineering Nanjing National Laboratory of Microstructure Nanjing University Nanjing 210093 China;
Jiangsu Provincial Key Laboratory of Advanced Photonic and Electronic Materials School of Electronics Science and Engineering Nanjing National Laboratory of Microstructure Nanjing University Nanjing 210093 China;
Jiangsu Provincial Key Laboratory of Advanced Photonic and Electronic Materials School of Electronics Science and Engineering Nanjing National Laboratory of Microstructure Nanjing University Nanjing 210093 China;
Jiangsu Provincial Key Laboratory of Advanced Photonic and Electronic Materials School of Electronics Science and Engineering Nanjing National Laboratory of Microstructure Nanjing University Nanjing 210093 China;
Jiangsu Provincial Key Laboratory of Advanced Photonic and Electronic Materials School of Electronics Science and Engineering Nanjing National Laboratory of Microstructure Nanjing University Nanjing 210093 China;
Jiangsu Provincial Key Laboratory of Advanced Photonic and Electronic Materials School of Electronics Science and Engineering Nanjing National Laboratory of Microstructure Nanjing University Nanjing 210093 China;