An improved method has been developed for enriching and determining trace In,Pt,Sn,Co,Hg,Pb,Ni,Bi,Pd,Cu and Ag in high-purity gallium.Sample was treated by PDM（partial dissolution of matrix）withHCl（11mol/L）-HNO3（0.5mol/L）to a small residue of which Ga was then removed by extraction with 1 mlisopropyl ether.The concentrated impurities were determined by AES procedure.The recoveries for the ele-ments at the range of 0.02～0.2 μg are 95～103％;the relative standard deviations for determined impuritiesovera rangeofn.10-7～n·10-8％ are 4.3～12％;the detection limit of most elements can reach n·10-7～n·10-8％ level with the exception of Hg and Pt.This method has been successfully used to analyze many sam-ples sent by factories and institutes.
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