基于内部故障引弧试验的综合配电箱结构优化

摘要

为了减小综合配电箱内部故障电弧带来的危害,引入了一种基于内部故障引弧试验的方法,设计了恰当的试验系统,并进行了严格的现场试验和数据分析.结果表明,综合配电箱的故障电弧薄弱点主要集中在主母排末端附近,配电回路断路器出线端及补偿回路进线端次之.在此基础上,提出了一些简单实用的结构优化方案,为企业生产安全可靠的综合配电箱提供一定的技术指导.%In order to reduce harms caused by the internal fault arc of the integrated distribution box,this paper introduces a method based on the internal fault arcing test by which an appropriate experimental system is designed,and the strict field test and data analysis is carried out.The results show that fault arc vulnerabilities of the integrated distribution box are mainly concentrated near the main bus-bar terminal while fewer vulnerabilities occur to the outgoing terminal of the breaker of power distribution circuit and incoming terminal of the compensation circuit.On this basis,some simple and practical structure optimization schemes are put forward,which can provide certain technical guidance for enterprises to make safe and reliable integrated distribution boxes.