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Abnormal Enhancement of N2+ Emission Induced by Lower Frequency in N2 Dual-Frequency Capacitively Coupled Plasmas

机译:N2双频电容耦合等离子体中较低频率引起的N2 +排放异常增强

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摘要

Nitrogen dual-frequency capacitively coupled plasmas (DF-CCPs) with different fre- quency configurations, i.e., 60/2 MHz and 60/13.56 MHz, are investigated by means of opticM emission spectroscopy (OES) and a floating double probe. The excited nitrogen molecule ion N+(B) is monitored by measuring the emission intensity of the (0,0) bandhead of the first neg- ative system (FNS) at 391.44 nm. It is shown that in the discharge with 60/13.56 MHz, the N+ emission intensity decreases with the increase in pressure. In the discharge with 60/2 MHz, however, an abnormal enhancement of N+ emission at higher pressure is observed when a higher power of 2 MHz is added. Variation in the ion density shows a similar dependence on the gas pressure. This indicates that in the discharge with 60/2 MHz there is a mode transition from the alpha to gamma type when a higher power of 2 MHz is added at high pressures. Combining the measurements using OES and double probe, the influence of low frequency on the discharge is investigated and the excitation route of the N+(B) state in the discharge of 60/2 MHz is also discussed.
机译:利用光学M发射光谱(OES)和浮置双探针研究了具有不同频率配置(即60/2 MHz和60 / 13.56 MHz)的氮气双频电容耦合等离子体(DF-CCP)。通过测量第一个负系统(FNS)的(0,0)带状峰在391.44 nm处的发射强度来监测被激发的氮分子离子N +(B)。结果表明,在60 / 13.56 MHz的放电中,N +发射强度随压力的增加而降低。但是,在60/2 MHz的放电中,当添加2 MHz的较高功率时,会观察到N +在较高压力下的发射异常增强。离子密度的变化显示出对气压的类似依赖性。这表明,在高压下添加2 MHz的较高功率时,在60/2 MHz的放电中会发生从α型到γ型的模式转换。结合使用OES和双探头的测量,研究了低频对放电的影响,并讨论了60/2 MHz放电中N +(B)态的激发路径。

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