首页> 中文期刊>等离子体科学与技术:英文版 >Line identification of boron and nitrogen emissions in extreme-and vacuumultraviolet wavelength ranges in the impurity powder dropping experiments of the Large Helical Device and its application to spectroscopic diagnostics

Line identification of boron and nitrogen emissions in extreme-and vacuumultraviolet wavelength ranges in the impurity powder dropping experiments of the Large Helical Device and its application to spectroscopic diagnostics

     

摘要

An impurity powder dropper was installed in the 21 st campaign of the Large Helical Device experiment(Oct.2019–Feb.2020)under a collaboration between the National Institute for Fusion Science and the Princeton Plasma Physics Laboratory for the purposes of real-time wall conditioning and edge plasma control.In order to assess the effective injection of the impurity powders,spectroscopic diagnostics were applied to observe line emission from the injected impurity.Thus,extreme-ultraviolet(EUV)and vacuum-ultraviolet(VUV)emission spectra were analyzed to summarize observable impurity lines with B and BN powder injection.Emission lines released from B and N ions were identified in the EUV wavelength range of 5–300Ameasured using two grazing incidence flat-field EUV spectrometers and in the VUV wavelength range of 300–2400Ameasured using three normal incidence 20 cm VUV spectrometers.BI–BV and NIII–NVII emission lines were identified in the discharges with the B and BN powder injection,respectively.Useful B and N emission lines which have large intensities and are isolated from other lines were successfully identified as follows:BI(1825.89,1826.40)A(blended),BII 1362.46A,BIII(677.00,677.14,677.16)A(blended),BIV 60.31A,BV 48.59A,NIII(989.79,991.51,991.58)A(blended),NIV765.15A,NV(209.27,209.31)A(blended),NVI 1896.80A,and NVII 24.78A.Applications of the line identifications to the advanced spectroscopic diagnostics were demonstrated,such as the vertical profile measurements for the BV and NVII lines using a space-resolved EUV spectrometer and the ion temperature measurement for the BII line using a normal incidence 3 m VUV spectrometer.

著录项

获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号