首页> 外文期刊>核技术:英文版 >Measurement of 8—25keV electron impact K—shell ionization cross sections of Cu and Co elements
【24h】

Measurement of 8—25keV electron impact K—shell ionization cross sections of Cu and Co elements

机译:Cu和Co元素的8-25keV电子冲击K-壳电离截面的测量

获取原文
获取原文并翻译 | 示例
       

摘要

The influence of substrate of thin targets on ionization cross sections has been corrected by a new method based upon the bipartition model of electron transport.The measured cross sections for Cu element are in good agreement with existing experimental data and those produced by the empirical formula of Green and Cosslett.Cross sections for Co element are measured for the first time.
机译:薄目标衬底对电离截面的影响已通过一种基于电子迁移双向模型的新方法进行了纠正。 Green和Cosslett.Co元素的横截面首次测量。

著录项

获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号