微区残余应力的毛细管X射线透镜检测方法

摘要

The low-power residual stress measurement systems have disadvantage of poor accuracy and low stability due to weak detectable diffraction intensity.In this paper, a capillary X-ray optics has been applied in residual stress measurement systems for micro-area measurement.Through the regulation of X-ray and the formation of micro irradiation area, the area under the same irradiation intensity increase several times, and the FWHM of diffraction moderate increases, the stress value has little effect on accuracy.%针对现有小功率残余应力仪在进行微区应力检测时,存在衍射强度低导致测试准确度低、稳定性差等问题,阐述了一种毛细管X射线透镜结合应力仪实现微区应力检测的方法.采用基于全反射原理的透镜,通过对X射线的调控,形成微区照射面积,将相同照射面积下的光强度提高数十倍,且在衍射半高宽适度增大的情况下,对检测出的应力值影响不大.