断路器并联电容器离子性缺陷介损特性分析

摘要

By the high voltage dielectric loss test on the type of JWF150-1500 and JWF150-0.0015GHW circuit-breaker parallel capacitors,discoveres that with voltage increase the dielectric loss value of some circuit-breaker parallel capacitors obvious change,exists ionic defect. Through the data and theoretical analysis,explains the reason of the dielectric loss change with voltage increase and the effects of ionic defects on circuit-breaker parallel capacitor,suggests the effective solution.The result shows that routine test and test before operation under 10 kV voltage,the tan δhas large measure deviation value, and with voltage change the high voltage dielectric loss decreased obviously,can judge the circuit-breaker parallel capacitor have ionic defect.%对JWF150-1500型和JWF150-0.0015GHW型断路器并联电容器进行高压介质损耗试验，发现部分断路器并联电容器随电压升高介损值变化明显，存在离子性缺陷。通过数据和理论分析，解释了断路器并联电容器介质损耗随电压变化的原因及离子性缺陷对断路器并联电容器影响，并提出有效解决措施。结果表明：例行试验与投运前试验时10 kV下tanδ测量值偏差较大，且高压介损随电压变化下降明显的断路器并联电容器，可认定存在离子性缺陷。